The Molecular Repair of the Brain by Ralph C. Merkle; Xerox PARC 3333 Coyote Hill Road Palo Alto, CA 94304 [email protected] Please see the separate article on Information-Theoretic Death for a more recent treatment of this fundamental concept.
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit
Methods and Applications in Fluorescence focuses on new developments in fluorescence spectroscopy, imaging, microscopy, fluorescent probes, labels and (nano)materials. It will feature both methods and advanced (bio)applications and accepts original research articles, reviews and technical notes.
German physicist Manfred, Freiherr (baron) von Ardenne, and British electronic engineer Charles Oatley laid the foundations of transmission electron microscopy (in which the electron beam travels through the specimen) and scanning electron microscopy (in which the electron beam ejects from the sample other electrons that are then analyzed), which are most notably recorded in Ardenne's book ...
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample.